APO干涉镜头| 干涉测量显微镜镜头
wdk 干涉测量镜头
适合非接触光学压型可选michelson (2x and 5x) 镜头f=200mm镜筒远场校正设计用途：
干涉测量镜头可用在非接触光学压型测量设备上，通过此镜头可得到表面位图和表面测量参数等。也可用来检测表面粗糙度，测量精度非常高，在一个波长之内。一束光通过分光镜，可将光直接射向样品表面和内置反光镜。从样品表面反射的光线通过再结合，就产生了干涉图案。michelson镜头拥有更长的工作距离，更宽的视场和更大的焦深。采用f=200mm镜筒的话可将镜头直接装配到c接口相机上。
wdk interferometry objectives
interferometry objectives are used in non-contact optical profile measurement devices to obtain surface maps and surface measurement parameters. they can be used to examine surface topography with very high precision—to within a fraction of the wavelength of light. in these objectives, a light beam passes through a beamsplitter, which directs the light to both the surface of the sample and a built-in reference mirror. the light reflected from these surfaces recombines and a fringe interference pattern is formed. the michelson objectives provide comparatively longer working distances, wider fields of view and larger depth of focus, whereas the the f=200mm tube lens allows these objectives to be integrated to a c-mount camera.
技术参数：
| 倍率 | 2x | 5x | ||||
| na | 0.055 | 0.14 | ||||
| w.d（mm） | 15 | 15 | ||||
| 焦点距離(mm) | 100 | 40 | ||||
| 分解能 (µm) | 5 | 2 | ||||
| 被写界深度(µm) | 91 | 14 | ||||
| 实视场2/3" sensor (mm) | 4.4 x 3.3 | 1.76 x 1.32 | ||||
| 实视场1/2" sensor (mm) | 3.2 x 2.4 | 1.28 x 0.96 | ||||
| 重量 (g) | 430 | 450 | ||||
本产品的类型是干涉镜头，品牌是WDK，型号是IFSAPO，目镜放大倍数是10X，物镜放大倍数是5X,2X，仪器放大倍数是50X,20X，重量是200（g），适用范围是干涉测量，装箱数是1，加工定制是否，规格是IFSAPO2X,IFSAPO5X
